The NIT LiSaSWIR 2048 Line Scan SWIR camera is perfect for industrial applications with its unique performances and features. Its 2048×1 pixels resolution with frame rate 60kHz, Bad Pixels Replacement and embedded Non-Uniformity Correction offer a comfortable Field of View for inspection of semiconductor/wafer/solar cell panel or food sorting, hot glass inspection.
The LiSaSWIR line-scan camera enables high performance machine vision imaging applications in the 900-1700 nm SWIR spectral region. 60 kHz frame rate is achieved through the CameraLink port at 2048 pixel resolution. The LiSa SWIR line scan camera comes with complete software tools for quick implementation of your machine vision application.
LiSa SWIR 2048 Line Scan Applications:
|Up to 60,000Hz Full Frame|
|2048 x 1|
|CameraLink™ or USB 3.0|
|46 x 46 x 65.5mm|
|0°C to +65°C|
(SWIR) Short-wave Infrared imaging is an advanced technique, used for producing images based on radiation within the electromagnetic spectrum. Infrared radiation is located between visible light and microwaves between 0.75 µm – 1mm wavelength. Infrared is split between 5 regions: Near-Infrared (NIR), Short-Wave Infrared (SWIR), Mid-Wave Infrared (MWIR), Long-Wave Infrared (LWIR), and Far Infrared (FIR). SWIR cameras can see even at night and under hard visible conditions lie clouds, smoke, or even dust. Another major benefit of SWIR imaging that is the ability to image through glass, great for inspection of products with no destruction.
InGaAs is an arcanum for the element composition of the material it makes (Indium, Gallium, Arsenide). NIT has developed and invested into a manufacturing line of InGaAs sensors using a unique and proprietary technology. InGaAs annoy absorbs IR light invisible to silicon and converts incident light into electrons digitized by the ROIC and the camera electronics. Adding this array to a ROIC, read-out integrated circuits, can be a challenging task in design and engineering. One of the critical steps is the 3D stacking of the photodiode array to the read-out circuit, for which NIT has developed a very innovative flip chip process ensuring the CMOS read out circuit at a sub-micron precision high yield and low cost of production.
SWIR imagers are used in a large number of applications including semiconductor inspection, laser alignment and beam profiling, hot glass inspection, security and surveillance, machine vision imaging, agricultural sensing, microscopy and life science imaging. Some examples are on our infrared and thermal imaging applications page (https://www.techimaging.com/applications/infrared-thermal-imaging-applications)
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